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14:20 Brett Hodges Research Talk (2020 Larock… Brett Hodges Research Talk (2020 Larock Conference, Physical/Analytical Presentation #3)	Brett Hodges Research Talk (2020 Larock Conference, Physical/Analytical Presentation #3) Title: Measurement of the space-charge region width in BiVO4 particle films with surface photovoltage spectroscopy Authors: Brett Hodges, Rachel Doughty, Anna Kundmann, and Frank E. Osterloh … region charge film space semiconductor films band surface width electrons interface energy signal degrees celsius field water bismuth material volts From Lee-Ping Wang on May 16th, 2020 0 likes 3 plays 0
10:29 MOS Transistors (Part 7: Channel-Length… MOS Transistors (Part 7: Channel-Length Modulation)	MOS Transistors (Part 7: Channel-Length Modulation) EEC110A: Electronic Circuits I Instructor: Hooman Rashtian Department of Electrical and Computer Engineering channel transistor vds length threshold voltage drain effect lambda point width base vgs modulation term vce current equation source slope From Hooman Rashtian on April 14th, 2020 0 likes 11 plays 0
06:29 Bipolar Transistors (Part 5: Early Effect) Bipolar Transistors (Part 5: Early Effect)	Bipolar Transistors (Part 5: Early Effect) EEC110A: Electronic Circuits I Instructor: Hooman Rashtian Department of Electrical and Computer Engineering vce region voltage electrons increases slope profile depletion transistor gradient effect base volt ic equation width collector vbe dependency side From Hooman Rashtian on April 14th, 2020 0 likes 4 plays 0
07:49 PN Junction (Part 5: Forward Bias) PN Junction (Part 5: Forward Bias)	PN Junction (Part 5: Forward Bias) region vd junction depletion bias times current holes diffusion width reverse power equation voltage electrons atoms boron ions side terminal From Hooman Rashtian on April 14th, 2020 0 likes 2 plays 0
09:45 PN Junction (Part 3): Reverse Bias PN Junction (Part 3): Reverse Bias	PN Junction (Part 3): Reverse Bias junction region side depletion battery capacitance bias naught capacitor plates electrons voltage equation equilibrium distance silicon material dielectric width holes From Hooman Rashtian on April 14th, 2020 0 likes 2 plays 0