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Characterizing Silicon Vacancies in Silicon… duration 56 seconds Characterizing Silicon Vacancies in Silicon… Characterizing Silicon Vacancies in Silicon Carbide - Eliana Mann	Characterizing Silicon Vacancies in Silicon Carbide - Eliana Mann Color centers are point defects in a crystal… ecexpo 2022 +20 More From Philip Young 0 likes 33 plays 0
A 17 Gb/s 10.7 pJ/b 4FSK Transceiver System for… duration 1 minute 2 seconds A 17 Gb/s 10.7 pJ/b 4FSK Transceiver System for… A 17 Gb/s 10.7 pJ/b 4FSK Transceiver System for Point to Point Communication in 65 nm CMOS - Hamidreza Afzal	A 17 Gb/s 10.7 pJ/b 4FSK Transceiver System for Point to Point Communication in 65 nm CMOS - Hamidreza Afzal Abstract — This paper presents a novel… ecexpo 2022 +20 More From Philip Young 0 likes 53 plays 0
Triangular Cross-section Waveguide Geometries in… duration 4 minutes 48 seconds Triangular Cross-section Waveguide Geometries in… Triangular Cross-section Waveguide Geometries in 4H-SiC for Efficient Integration of Color Centers	Triangular Cross-section Waveguide Geometries in 4H-SiC for Efficient Integration of Color Centers Photonic and Electronic Devices 23 Team Lead:… silicon +19 More From Femi-Jide Akinmoladun 0 likes 7 plays 0

Characterizing Silicon Vacancies in Silicon Carbide - Eliana Mann